Testing

Policy & Performance   •   Process  •   Testing   •   Certifications    • Memberships/Affiliations

Arcotek has partnered with Global ETS, an ISO/IEC 17025:20147 certified test house, offering many of the most comprehensive, next generation of independent component authentication and unparalleled quality testing services available in the industry today. 

In the event that product must be sourced from the open market, due to obsolescence or availability, we offer the following testing services:

Authentication Testing Accelerated Life Testing Electrical Testing Services Material Analysis Soldering Test  Failure Analysis Up-screening Testing Services

Authentication Testing

  • External Visual Inspection

  • Marking Permanency Testing

  • Acetone Testing

  • Methyl/Pryrrolidone Testing

  • Dynosolve 750 Testing

  • Decapsulation

  • X-Ray Analysis

For more information, please contact us at  Quality@arcotek.net  

Accelerated Life Testing

  • Hermetic Seal Testing

For more information, please contact us at  Quality@arcotek.net  

Electrical Testing Services

  • AC&DC Parametric Tests

  • DDR/DRAM Memory Testing

  • Extended MLCC Testing Services

  • JTAG and Boundary Scan

  • Transistor/Mosfet Testing

  • Memory Testing

  • RF Component Testing – Single

For more information, please contact us at  Quality@arcotek.net  

Material Analysis

  • Raman Spectroscopy Testing Services

  • SEM & EDS Testing Services

  • XRF

For more information, please contact us at  Quality@arcotek.net  

Soldering Test 

  • Wetting & Balance Test

  • Hot Solder Dip Solderability

  • BGA Re-Flow Solderability

For more information, please contact us at Quality@arcotek.net  

Failure Analysis

Pinpointing the root cause of a component board level failure can be very difficult since there are many variables including environmental factors, type of application, service life and pertinent design information and storage and handling. Our test house has developed a process that will not only confirm if your component is defective but also the root cause of the failure. While identifying the root causes and associated responsibilities of any failure are the primary goals, the added value is prevention of future occurrences.

For more information, please contact us at  Quality@arcotek.net  

Up-screening Testing Services

UP-SCREEN TO JAN, JANTX, AND JANS PER MIL-PRF-9500

Out Test House can screen or up-screen a wide array of devices including Transistors, IGBTs, Diodes, Rectifiers, Bridges, Zeners, Darlingtons, FETs, MOSFETs, JFETS, SCRs, Triacs, Optos, Arrays, Small Signal, Power Devices, Hybrid Modules, Dual, Quad and Octual using our high power discrete semiconductors automated test system with complete read and record all parameters.

For more information, please contact us at  Quality@arcotek.net